Revealing thermal effects in the electronic transport through irradiated atomic metal point contacts

• Bastian Kopp,
• Zhiwei Yi,
• Daniel Benner,
• Fang-Qing Xie,
• Christian Obermair,
• Thomas Schimmel,
• Johannes Boneberg,
• Paul Leiderer and
• Elke Scheer

Beilstein J. Nanotechnol. 2012, 3, 703–711, doi:10.3762/bjnano.3.80

• layer are the most prominent effects. Keywords: atom transistor; atomic contacts; cyclic voltammogram; electrochemically closed break junction; electronic transport; (Helmholtz) double layer; light-induced signals; temperature-induced changes; thermovoltage; Introduction Electronic transport on the

• microscope picture of a MCBJ before electrochemical deposition of Ag (bright-field illumination). (b) Optical microscope picture after the deposition of Ag (dark-field illumination). (a) Light-induced signal (red) of a dry, electrochemically closed break junction, and the laser pulse (blue). (b) Spatially